Ballistic electron emission microscopy or BEEM is a technique for studying ballistic electron transport through a variety of materials and material interfaces.
Douglas Bell and William Kaiser. A small fraction of these electrons will travel ballistically through the metal to the metal-semiconductor interface where they will encounter a Schottky barrier. Those electrons with sufficient energy to surmount the Schottky barrier will be detected as the BEEM current.
Beamline I06: Photo Emission Electron Microscope (PEEM)
From Wikipedia, the free encyclopedia. Physical Review Letters. Bibcode : PhRvL..
Annual Review of Materials Science. Bibcode : AnRMS..
Microscopy Microanalysis Microstructures. Scanning probe microscopy.
Scanning probe lithography Dip-pen nanolithography Feature-oriented scanning Millipede memory. Nanotechnology Microscope Microscopy Vibrational analysis.
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